ICP Suite

Virginia Ettwein with the Agilent 5800 ICP-OES

The Department of Earth Sciences ICP Suite provides high accuracy elemental analysis using two Inductively Coupled Plasma Mass Spectrometry (ICP-MS) instruments and one Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES) instrument. The ICP methods can be used to measure trace, minor and major element concentrations in a variety of sample media. Our facility hosts the only ICP-OES instrument at the University of Oxford, and a rare ability to analyse individual particles on our high-sensitivity ICP-MS instrument.

Our expert team can provide guidance on how best to perform your desired analysis, so please get in touch to discuss your requirements.

Sample Types

Our ICP instruments can measure a vast array of sample types, including:

  • Natural water samples
  • Digested rock samples
  • Individual cells and particles
  • Hydrothermal fluids and volcanic brines
  • Seawater
  • Chemical plant effluent

The Suite has recently performed analysis for Herriot-Watt University, Ascension Earth Resources, University of Oxford Department of Chemistry, and James Cropper Ltd.

Available Support

We can offer a comprehensive analysis package, including:

  1. Single and multi-element standards and calibrations
  2. Quality assurance and accuracy verification
  3. Training on instrument use
  4. Full data reporting for external clients

Contact Information

Interested in using the ICP Suite? For rates, training, or to schedule use, please contact Phil Holdship at philip.holdship@earth.ox.ac.uk.

ICP-MS

Inductively Coupled Plasma Mass Spectrometry (ICP-MS) is a powerful inorganic technique that resolves the abundance of many chemical elements to extremely low detection limits (generally on the order of parts per billion, ppb) over wide concentration ranges. It is suitable for measuring concentrations of most minor and trace elements. The driving force behind this high-performing and versatile technique is the high temperature argon plasma, which is hot enough to excite most elements within the periodic table into ions. 

Phil Holdship with the PerkinElmer NexION 350D Quadropole ICP-MS

PerkinElmer NexION 350D Quadropole ICP-MS

The PerkinElmer NexION 350D quadrupole ICP-MS provides accurate, reproducible minor and trace element analysis. The instrument is fitted with a quadrupole reaction cell with dynamic bandpass tuning, ensuring reliable and repeatable reactions and eliminating reaction byproducts.

Key Features
  • Elemental Scientific prepFAST automated sample preparation system, capable of online dilutions, calibration and internal standard additions
  • Single quadrupole for reliable measurement
  • Detection in the range of parts per billion (10-9 g/g) to parts per trillion (10-12 g/g) depending on the element
PerkinElmer NexION 5000 Multi-Quadropole ICP-MS

PerkinElmer NexION 5000 Multi-Quadropole ICP-MS

The PerkinElmer NexION 5000 multi-Quadropole ICP-MS provides ultra-sensitive trace element analysis. The multi-quadrupole system provides dual mass spectral filtering - removing interference and producing a clean signal, even at low concentrations. The 5000 ICP-MS is 5-10x more sensitive than the 350D Quadropole, making it particularly suitable for measurements of Rare Earth Elements and method development work.

Key Features
  • Elemental Scientific prepFAST automated sample preparation system, capable of online dilutions, calibration and internal standard additions
  • Multi-quadrupole (MS-MS system) which provides clean signals at low (sub-ppb) concentrations
  • Extremely high sensitivity measurements of trace elements
  • Single cell sample introduction, which allows for measurement of individual particles and cells in isolation
  • Detection in the range of parts per trillion (10-12 g/g) for most elements

ICP-MS Sample Requirements

Samples must be:

  • Minimum 2.5 ml, ideally 5 ml
  • Dissolved in 2 % v/v HNO3
  • Free of particulates, passed through a 40 micron filter
  • Fewer than 2,000 ppm (0.2 %) total dissolved solids (TDS) (or notify prior to analysis)

ICP-OES

Inductively coupled plasma optical emission spectroscopy (ICP-OES) is a versatile technique for measuring elemental concentrations on the order of parts per million (ppm). It is suitable for measuring concentrations of most major and intermediate elements. ICP-OES measures the energy associated with electron movement, detecting the light energy emitted at characteristic wavelengths when valence electrons decay from a high energy state to the ground state after atoms and ions have been excited by the plasma.

Agilent 5800 ICP-OES

Agilent 5800 ICP-OES

The Agilent 5800 ICP-OES provides unmatched major element analysis and semiquantitative rapid elemental screening. It has a high matrix tolerance and can be used to measure brines and other salt-rich solutions.

Key Features
  • Agilent ADS 2 autodiluter, capable of dilutions and internal standard additions
  • Capability of high sensitivity measurements via axial viewing or robust measurements via radial viewing
  • Semi-quantitative rapid screening which provides a heatmap of periodic table composition within 20 minutes
  • Detection in the range of parts per million (10-6 g/g to 10-8 g/g) depending on the element

ICP-OES Sample Requirements

Samples must be:

  • Minimum 10 ml, ideally 20 ml
  • Dissolved in 2 % v/v HNO3
  • Free of particulates, passed through a 40 micron filter
  • Ideally fewer than 2,000 ppm (0.2 %) total dissolved solids (TDS), but can be operated up to 20,000 ppm (20 %) (or notify prior to analysis)
ICP Samples in Test Tubes